Model-in-the-Loop for Embedded System... - Justyna Zander

Tools / Development Tools

In Model-in-the-Loop for Embedded System Test (MiLEST) the developed signal-feature d-deOCt oriented paradigm allows the abstract description of signals and their properties. It addresses the problem of missing reference signal flows as well as the issue of systematic test data selection. Numerous signal features are identified. Furthermore, predefined test patterns help build hierarchical test specifications, which enables a construc-tion of...